# Validating the Use of Conductive Atomic Force Microscopy for Defect Quantification in 2D Materials

> Research article (ACS Nano, 2023) · cited 25× · AI/ML

**Wikidata**: [openalex:W4389726897](https://www.wikidata.org/wiki/openalex:W4389726897)  
**Source**: https://4ort.xyz/entity/validating-the-use-of-conductive-atomic-force-microscopy-for-defect-quantification-in-2d-materials