# Utilizing YOLO Models for Real-World Scenarios: Assessing Novel Mixed Defect Detection Dataset in PCBs

> Research article (IEEE Access, 2024) · cited 22× · AI/ML

**Wikidata**: [openalex:W4400770913](https://www.wikidata.org/wiki/openalex:W4400770913)  
**Source**: https://4ort.xyz/entity/utilizing-yolo-models-for-real-world-scenarios-assessing-novel-mixed-defect-detection-dataset-in-pcbs