# Using Similarity Metrics to Quantify Differences in High-Throughput Data Sets: Application to X-ray Diffraction Patterns

> Research article (ACS Combinatorial Science, 2016) · cited 29× · AI/ML

**Wikidata**: [openalex:W2558607729](https://www.wikidata.org/wiki/openalex:W2558607729)  
**Source**: https://4ort.xyz/entity/using-similarity-metrics-to-quantify-differences-in-high-throughput-data-sets-application-to-x-ray-diffraction-patterns