# Using active thermography to inspect pin-hole defects in anti-reflective coating with k-mean clustering

> Research article (NDT & E International, 2015) · cited 20× · AI/ML

**Wikidata**: [openalex:W1710458941](https://www.wikidata.org/wiki/openalex:W1710458941)  
**Source**: https://4ort.xyz/entity/using-active-thermography-to-inspect-pin-hole-defects-in-anti-reflective-coating-with-k-mean-clustering