# Unveiling the Influence of Channel Thickness on PBTI and LFN in Sub-10 nm-thick IGZO FETs: A Holistic Perspective for Advancing Oxide Semiconductor Devices

> Research article (2023 International Electron Devices Meeting (IEDM), 2023) · cited 17× · AI/ML

**Wikidata**: [openalex:W4391594326](https://www.wikidata.org/wiki/openalex:W4391594326)  
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