# Unsupervised Pre-Training of Imbalanced Data for Identification of Wafer Map Defect Patterns

> Research article (IEEE Access, 2021) · cited 43× · AI/ML

**Wikidata**: [openalex:W3137048602](https://www.wikidata.org/wiki/openalex:W3137048602)  
**Source**: https://4ort.xyz/entity/unsupervised-pre-training-of-imbalanced-data-for-identification-of-wafer-map-defect-patterns