# Unsupervised machine learning application to identify single-event transients (SETs) from noise events in MOSFET transistor ionizing radiation effects

> Research article (Microelectronics Reliability, 2023) · cited 12× · AI/ML

**Wikidata**: [openalex:W4318572598](https://www.wikidata.org/wiki/openalex:W4318572598)  
**Source**: https://4ort.xyz/entity/unsupervised-machine-learning-application-to-identify-single-event-transients-sets-from-noise-events-in-mosfet-transisto