# Unsupervised Anomaly Detection for Surface Defects With Dual-Siamese Network

> Research article (IEEE Transactions on Industrial Informatics, 2022) · cited 103× · AI/ML

**Wikidata**: [openalex:W4206551889](https://www.wikidata.org/wiki/openalex:W4206551889)  
**Source**: https://4ort.xyz/entity/unsupervised-anomaly-detection-for-surface-defects-with-dual-siamese-network