# Unseen-Material Few-Shot Defect Segmentation With Optimal Bilateral Feature Transport Network

> Research article (IEEE Transactions on Industrial Informatics, 2022) · cited 22× · AI/ML

**Wikidata**: [openalex:W4312951523](https://www.wikidata.org/wiki/openalex:W4312951523)  
**Source**: https://4ort.xyz/entity/unseen-material-few-shot-defect-segmentation-with-optimal-bilateral-feature-transport-network