# Uniformity and Retention Improvement of TaO<sub>x</sub>-Based Conductive Bridge Random Access Memory by CuSiN Interfacial Layer Engineering

> Research article (IEEE Electron Device Letters, 2017) · cited 13× · AI/ML

**Wikidata**: [openalex:W2744072229](https://www.wikidata.org/wiki/openalex:W2744072229)  
**Source**: https://4ort.xyz/entity/uniformity-and-retention-improvement-of-tao-sub-x-sub-based-conductive-bridge-random-access-memory-by-cusin-interfacial-