# Understanding and Modeling On-Die Error Correction in Modern DRAM: An Experimental Study Using Real Devices

> Research article (2019 49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), 2019) · cited 59× · AI/ML

**Wikidata**: [openalex:W2969618534](https://www.wikidata.org/wiki/openalex:W2969618534)  
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