# Ultra-Low Noise Defect Probing Instrument for Defect Spectroscopy of MOS Transistors

> Research article (IEEE Transactions on Device and Materials Reliability, 2020) · cited 26× · AI/ML

**Wikidata**: [openalex:W3018082668](https://www.wikidata.org/wiki/openalex:W3018082668)  
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