# Two-stage low power test data compression for digital VLSI circuits

> Research article (Computers & Electrical Engineering, 2018) · cited 14× · AI/ML

**Wikidata**: [openalex:W2886883784](https://www.wikidata.org/wiki/openalex:W2886883784)  
**Source**: https://4ort.xyz/entity/two-stage-low-power-test-data-compression-for-digital-vlsi-circuits