# True Atomic-Resolution Surface Imaging and Manipulation under Ambient Conditions via Conductive Atomic Force Microscopy

> Research article (ACS Nano, 2022) · cited 41× · AI/ML

**Wikidata**: [openalex:W4307208416](https://www.wikidata.org/wiki/openalex:W4307208416)  
**Source**: https://4ort.xyz/entity/true-atomic-resolution-surface-imaging-and-manipulation-under-ambient-conditions-via-conductive-atomic-force-microscopy
