# Trap Analysis Based on Low-Frequency Noise for SiC Power MOSFETs Under Repetitive Short-Circuit Stress

> Research article (IEEE Journal of the Electron Devices Society, 2020) · cited 24× · AI/ML

**Wikidata**: [openalex:W3004950228](https://www.wikidata.org/wiki/openalex:W3004950228)  
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