# Training Neural Network for Machine Intelligence in Automatic Test Pattern Generator

> Research article (2021 34th International Conference on VLSI Design and 2021 20th International Conference on Embedded Systems (VLSID), 2021) · cited 27× · AI/ML

**Wikidata**: [openalex:W3158327736](https://www.wikidata.org/wiki/openalex:W3158327736)  
**Source**: https://4ort.xyz/entity/training-neural-network-for-machine-intelligence-in-automatic-test-pattern-generator
