# Towards in-process x-ray CT for dimensional metrology

> Research article (Measurement Science and Technology, 2016) · cited 61× · AI/ML

**Wikidata**: [openalex:W2341970370](https://www.wikidata.org/wiki/openalex:W2341970370)  
**Source**: https://4ort.xyz/entity/towards-in-process-x-ray-ct-for-dimensional-metrology
