# Toward Optimal Defect Detection in Assembled Printed Circuit Boards Under Adverse Conditions

> Research article (IEEE Access, 2023) · cited 12× · AI/ML

**Wikidata**: [openalex:W4388430603](https://www.wikidata.org/wiki/openalex:W4388430603)  
**Source**: https://4ort.xyz/entity/toward-optimal-defect-detection-in-assembled-printed-circuit-boards-under-adverse-conditions