# Total-Ionizing-Dose Effects and Low-Frequency Noise in 30-nm Gate-Length Bulk and SOI FinFETs With SiO<sub>2</sub>/HfO<sub>2</sub>Gate Dielectrics

> Research article (IEEE Transactions on Nuclear Science, 2019) · cited 43× · AI/ML

**Wikidata**: [openalex:W2996049479](https://www.wikidata.org/wiki/openalex:W2996049479)  
**Source**: https://4ort.xyz/entity/total-ionizing-dose-effects-and-low-frequency-noise-in-30-nm-gate-length-bulk-and-soi-finfets-with-sio-sub-2-sub-hfo-sub