# ToF-SIMS Depth Profiling of Organic Delta Layers with Low-Energy Cesium Ions: Depth Resolution Assessment

> Research article (Journal of the American Society for Mass Spectrometry, 2019) · cited 24× · AI/ML

**Wikidata**: [openalex:W2943356720](https://www.wikidata.org/wiki/openalex:W2943356720)  
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