# Time-of-flight secondary ion mass spectrometry in the helium ion microscope

> Research article (Ultramicroscopy, 2018) · cited 27× · AI/ML

**Wikidata**: [openalex:W2905639021](https://www.wikidata.org/wiki/openalex:W2905639021)  
**Source**: https://4ort.xyz/entity/time-of-flight-secondary-ion-mass-spectrometry-in-the-helium-ion-microscope