# Thermally Triggered SiC MOSFET Aging Effect on Conducted EMI

> Research article (2018 IEEE 6th Workshop on Wide Bandgap Power Devices and Applications (WiPDA), 2018) · cited 10× · AI/ML

**Wikidata**: [openalex:W2905323540](https://www.wikidata.org/wiki/openalex:W2905323540)  
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