# The Over-Reset Phenomenon in Ta<sub>2</sub>O<sub>5</sub> RRAM Device Investigated by the RTN-Based Defect Probing Technique

> Research article (IEEE Electron Device Letters, 2018) · cited 20× · AI/ML

**Wikidata**: [openalex:W2802080512](https://www.wikidata.org/wiki/openalex:W2802080512)  
**Source**: https://4ort.xyz/entity/the-over-reset-phenomenon-in-ta-sub-2-sub-o-sub-5-sub-rram-device-investigated-by-the-rtn-based-defect-probing-technique