# The Impact of a Number of Samples on Unsupervised Feature Extraction, Based on Deep Learning for Detection Defects in Printed Circuit Boards

> Research article (Future Internet, 2021) · cited 12× · AI/ML

**Wikidata**: [openalex:W4200586721](https://www.wikidata.org/wiki/openalex:W4200586721)  
**Source**: https://4ort.xyz/entity/the-impact-of-a-number-of-samples-on-unsupervised-feature-extraction-based-on-deep-learning-for-detection-defects-in-pri
