# The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision

> Research article (Ultramicroscopy, 2020) · cited 86× · AI/ML

**Wikidata**: [openalex:W3021000270](https://www.wikidata.org/wiki/openalex:W3021000270)  
**Source**: https://4ort.xyz/entity/the-exit-wave-power-cepstrum-transform-for-scanning-nanobeam-electron-diffraction-robust-strain-mapping-at-subnanometer-