# Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions

> Research article (2021 IEEE International Test Conference (ITC), 2021) · cited 12× · AI/ML

**Wikidata**: [openalex:W4242838932](https://www.wikidata.org/wiki/openalex:W4242838932)  
**Source**: https://4ort.xyz/entity/testing-stt-mram-manufacturing-defects-fault-models-and-test-solutions