# Test Time Minimization in Reconfigurable Scan Networks

> Research article (2016 IEEE 25th Asian Test Symposium (ATS), 2016) · cited 12× · AI/ML

**Wikidata**: [openalex:W2567151940](https://www.wikidata.org/wiki/openalex:W2567151940)  
**Source**: https://4ort.xyz/entity/test-time-minimization-in-reconfigurable-scan-networks