# Test-cost optimization in a scan-compression architecture using support-vector regression

> Research article (2017 IEEE 35th VLSI Test Symposium (VTS), 2017) · cited 18× · AI/ML

**Wikidata**: [openalex:W2615664485](https://www.wikidata.org/wiki/openalex:W2615664485)  
**Source**: https://4ort.xyz/entity/test-cost-optimization-in-a-scan-compression-architecture-using-support-vector-regression