# Test Case Generation Method for Increasing Software Reliability in Safety-Critical Embedded Systems

> Research article (Electronics, 2020) · cited 13× · AI/ML

**Wikidata**: [openalex:W3025819759](https://www.wikidata.org/wiki/openalex:W3025819759)  
**Source**: https://4ort.xyz/entity/test-case-generation-method-for-increasing-software-reliability-in-safety-critical-embedded-systems