# Test and Yield Loss Reduction of AI and Deep Learning Accelerators

> Research article (IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2021) · cited 31× · AI/ML

**Wikidata**: [openalex:W3119922080](https://www.wikidata.org/wiki/openalex:W3119922080)  
**Source**: https://4ort.xyz/entity/test-and-yield-loss-reduction-of-ai-and-deep-learning-accelerators