# Test and Reliability of Emerging Non-volatile Memories

> Research article (2017 IEEE 26th Asian Test Symposium (ATS), 2017) · cited 21× · AI/ML

**Wikidata**: [openalex:W2786883037](https://www.wikidata.org/wiki/openalex:W2786883037)  
**Source**: https://4ort.xyz/entity/test-and-reliability-of-emerging-non-volatile-memories