# Temperature-Gradient-Based Burn-In and Test Scheduling for 3-D Stacked ICs

> Research article (IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2015) · cited 12× · AI/ML

**Wikidata**: [openalex:W2107697793](https://www.wikidata.org/wiki/openalex:W2107697793)  
**Source**: https://4ort.xyz/entity/temperature-gradient-based-burn-in-and-test-scheduling-for-3-d-stacked-ics