# System-Level Vulnerability Assessment for EME: From Fault Tree Analysis to Bayesian Networks—Part II: Illustration to Microcontroller System

> Research article (IEEE Transactions on Electromagnetic Compatibility, 2015) · cited 17× · AI/ML

**Wikidata**: [openalex:W2291671891](https://www.wikidata.org/wiki/openalex:W2291671891)  
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