# Suppressing Electron Exposure Artifacts: An Electron Scanning Paradigm with Bayesian Machine Learning

> Research article (Microscopy and Microanalysis, 2016) · cited 19× · AI/ML

**Wikidata**: [openalex:W2486196027](https://www.wikidata.org/wiki/openalex:W2486196027)  
**Source**: https://4ort.xyz/entity/suppressing-electron-exposure-artifacts-an-electron-scanning-paradigm-with-bayesian-machine-learning
