# Super-Resolution Defect Characterization Using Microwave Near-Field Resonance Reflectometry and Cross-correlation Image Processing

> Research article (Sensing and Imaging, 2017) · cited 10× · AI/ML

**Wikidata**: [openalex:W2572333787](https://www.wikidata.org/wiki/openalex:W2572333787)  
**Source**: https://4ort.xyz/entity/super-resolution-defect-characterization-using-microwave-near-field-resonance-reflectometry-and-cross-correlation-image-