# Study on an Artificial Intelligence Based Kernel Ridge Regression Algorithm for Wafer Level Package Reliability Prediction

> Research article (2021 IEEE 71st Electronic Components and Technology Conference (ECTC), 2021) · cited 11× · AI/ML

**Wikidata**: [openalex:W3192540209](https://www.wikidata.org/wiki/openalex:W3192540209)  
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