# Study of Hot-Carrier-Induced Traps in Nanoscale UTBB FD-SOI MOSFETs by Low-Frequency Noise Measurements

> Research article (IEEE Transactions on Electron Devices, 2016) · cited 12× · AI/ML

**Wikidata**: [openalex:W2472152829](https://www.wikidata.org/wiki/openalex:W2472152829)  
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