# Studies of x-ray localization and thickness dependence in atomic-scale elemental mapping by STEM energy-dispersive x-ray spectroscopy using single-frame scanning method

> Research article (Ultramicroscopy, 2017) · cited 19× · AI/ML

**Wikidata**: [openalex:W2774906841](https://www.wikidata.org/wiki/openalex:W2774906841)  
**Source**: https://4ort.xyz/entity/studies-of-x-ray-localization-and-thickness-dependence-in-atomic-scale-elemental-mapping-by-stem-energy-dispersive-x-ray