# Structural characterization of polycrystalline thin films by X-ray diffraction techniques

> Research article (Journal of Materials Science Materials in Electronics, 2021) · cited 206× · AI/ML

**Wikidata**: [openalex:W3119722285](https://www.wikidata.org/wiki/openalex:W3119722285)  
**Source**: https://4ort.xyz/entity/structural-characterization-of-polycrystalline-thin-films-by-x-ray-diffraction-techniques