# Stress-Lysis: A DNN-Integrated Edge Device for Stress Level Detection in the IoMT

> Research article (IEEE Transactions on Consumer Electronics, 2019) · cited 93× · AI/ML

**Wikidata**: [openalex:W2972700485](https://www.wikidata.org/wiki/openalex:W2972700485)  
**Source**: https://4ort.xyz/entity/stress-lysis-a-dnn-integrated-edge-device-for-stress-level-detection-in-the-iomt