# Storage Reliability of Multi-bit Flash Oriented to Deep Neural Network

> Research article (2019 IEEE International Electron Devices Meeting (IEDM), 2019) · cited 15× · AI/ML

**Wikidata**: [openalex:W3006575968](https://www.wikidata.org/wiki/openalex:W3006575968)  
**Source**: https://4ort.xyz/entity/storage-reliability-of-multi-bit-flash-oriented-to-deep-neural-network