# Statistically Representative Metrology of Nanoparticles via Unsupervised Machine Learning of TEM Images

> Research article (Nanomaterials, 2021) · cited 37× · AI/ML

**Wikidata**: [openalex:W3206915114](https://www.wikidata.org/wiki/openalex:W3206915114)  
**Source**: https://4ort.xyz/entity/statistically-representative-metrology-of-nanoparticles-via-unsupervised-machine-learning-of-tem-images