# Statistical Analysis of Random Telegraph Noises of MOSFET Subthreshold Currents Using a 1M Array Test Chip in a 40 nm Process

> Research article (IEEE Journal of the Electron Devices Society, 2021) · cited 10× · AI/ML

**Wikidata**: [openalex:W3206683925](https://www.wikidata.org/wiki/openalex:W3206683925)  
**Source**: https://4ort.xyz/entity/statistical-analysis-of-random-telegraph-noises-of-mosfet-subthreshold-currents-using-a-1m-array-test-chip-in-a-40-nm-pr