# State of the art and challenges for test and reliability of emerging nonvolatile resistive memories

> Research article (International Journal of Circuit Theory and Applications, 2017) · cited 15× · AI/ML

**Wikidata**: [openalex:W2763315752](https://www.wikidata.org/wiki/openalex:W2763315752)  
**Source**: https://4ort.xyz/entity/state-of-the-art-and-challenges-for-test-and-reliability-of-emerging-nonvolatile-resistive-memories