# Spot and Learn: A Maximum-Entropy Patch Sampler for Few-Shot Image Classification

> Research article (2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), 2019) · cited 88× · AI/ML

**Wikidata**: [openalex:W2967333288](https://www.wikidata.org/wiki/openalex:W2967333288)  
**Source**: https://4ort.xyz/entity/spot-and-learn-a-maximum-entropy-patch-sampler-for-few-shot-image-classification