# Special Session: Reliability Analysis for AI/ML Hardware

> Research article (2021 IEEE 39th VLSI Test Symposium (VTS), 2021) · cited 30× · AI/ML

**Wikidata**: [openalex:W3166958299](https://www.wikidata.org/wiki/openalex:W3166958299)  
**Source**: https://4ort.xyz/entity/special-session-reliability-analysis-for-ai-ml-hardware