# Special Session – Machine Learning in Test: A Survey of Analog, Digital, Memory, and RF Integrated Circuits

> Research article (2021 IEEE 39th VLSI Test Symposium (VTS), 2021) · cited 19× · AI/ML

**Wikidata**: [openalex:W3172942293](https://www.wikidata.org/wiki/openalex:W3172942293)  
**Source**: https://4ort.xyz/entity/special-session-machine-learning-in-test-a-survey-of-analog-digital-memory-and-rf-integrated-circuits