# Special Session: Machine Learning for Semiconductor Test and Reliability

> Research article (2021 IEEE 39th VLSI Test Symposium (VTS), 2021) · cited 11× · AI/ML

**Wikidata**: [openalex:W3171204660](https://www.wikidata.org/wiki/openalex:W3171204660)  
**Source**: https://4ort.xyz/entity/special-session-machine-learning-for-semiconductor-test-and-reliability