# Special Session: Delay Fault Testing - Present and Future

> Research article (2019 IEEE 37th VLSI Test Symposium (VTS), 2019) · cited 14× · AI/ML

**Wikidata**: [openalex:W2956496679](https://www.wikidata.org/wiki/openalex:W2956496679)  
**Source**: https://4ort.xyz/entity/special-session-delay-fault-testing-present-and-future