# Sources of variability in scaled MoS<sub>2</sub> FETs

> Research article (2020 IEEE International Electron Devices Meeting (IEDM), 2020) · cited 22× · AI/ML

**Wikidata**: [openalex:W3137972591](https://www.wikidata.org/wiki/openalex:W3137972591)  
**Source**: https://4ort.xyz/entity/sources-of-variability-in-scaled-mos-sub-2-sub-fets